EP2631631
PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE
Status:
EP einkaleyfi: Þýðing ekki lögð innEP appl. date:
14.11.2011EP published:
20.1.2016EP application number:
11843762.3
EPO information:
European Patent Register
Max expiry date:
13.11.2031
Title:
PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE
Timeline
Today
14.11.2011EP application
20.1.2016EP Publication
Owner
Name:
Olympus CorporationAddress:
2951 Ishikawa-machi, Hachioji-shi,, 192-8507, Tokyo, JP
Inventor
Name:
HANASHI, TakuyaAddress:
Hachioji-shi, Tokyo, JP
Name:
TANABE, TetsuyaAddress:
Hachioji-shi, Tokyo, JP
Name:
YAMAGUCHI, MitsushiroAddress:
Hachioji-shi, Tokyo, JP
Priority
Number:
2010262267Date:
25.11.2010Country:
JP
Classification
Categories:
G01N 21/64, G02B 21/00