EP3423782
DEVICE AND METHOD FOR MEASURING THE PARAMETERS OF PHASE ELEMENTS
Status:
EP einkaleyfi: Þýðing ekki lögð innEP appl. date:
30.11.2015EP published:
26.1.2022EP application number:
15823404.7
EPO information:
European Patent Register
Max expiry date:
29.11.2035
Title in English:
DEVICE AND METHOD FOR MEASURING THE PARAMETERS OF PHASE ELEMENTSLanguage of the patent:
English
Timeline
Today
30.11.2015EP application
26.1.2022EP Publication
Owner
Name:
Polskie Centrum Fotoniki i SwiatlowodówAddress:
ul. Stanislawa Dubois 6/3, 20-061 Lublin, PL
Inventor
Name:
STEPIEN, KarolAddress:
01-134 Warszawa, PL
Name:
JÓZWIK, MichalinaAddress:
16-300 Augustów, PL
Name:
NAPIERALA, MarekAddress:
01-476 Warszawa, PL
Name:
ZIOLOWICZ, AnnaAddress:
25-752 Kielce, PL
Name:
SZOSTKIEWICZ, LukaszAddress:
97-100 Torun, PL
Name:
MURAWSKI, MichalAddress:
01-318 Warszawa, PL
Name:
LIPINSKI, StanislawAddress:
13-240 Ilowo, PL
Name:
HOLDYNSKI, ZbigniewAddress:
01-129 Warszawa, PL
Name:
STANCZYK, TomaszAddress:
05-500 Piaseczno, PL
Name:
NASILOWSKI, TomaszAddress:
00-172 Warszawa, PL
Priority
Number:
41406415Date:
18.9.2015Country:
PL
Classification
Categories:
G01B 9/02, G01M 11/02, G01M 11/00, G01B 11/06