EP3472599

A METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS

  • Status:
    EP einkaleyfi: Þýðing ekki lögð inn
  • EP appl. date:
    4.4.2017
  • EP published:
    1.6.2022
  • EP application number:
    17778790.0
  • Max expiry date:
    3.4.2037
  • Title in English:
    A METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS
  • Language of the patent:
    English

Timeline

Today
4.4.2017EP application
1.6.2022EP Publication

Owner

  • Name:
    Soreq Nuclear Research Center
  • Address:
    Nahal Soreq, 81800 Yavne, IL
  • Name:
    Security Matters Ltd.
  • Address:
    Kibbutz Ketura, 8884000 D.N. Hevel Eilot, IL

Inventor

  • Name:
    GROF, Yair
  • Address:
    7640658 Rehovot, IL
  • Name:
    KISLEV, Tzemah
  • Address:
    7680400 Mazkeret Bathya, IL
  • Name:
    YORAN, Nadav
  • Address:
    6998250 Tel Aviv, IL
  • Name:
    ALON, Haggai
  • Address:
    Naan, IL

Priority

  • Number:
    201662317859 P
  • Date:
    4.4.2016
  • Country:
    US

Classification

  • Categories:
    G01N 23/223, H05K 1/02, H05K 1/03, H05K 1/09, H05K 1/11, H05K 1/18, H05K 3/28, H05K 3/34, H05K 3/22, A61B 5/024, A61B 5/0255, A61B 5/00

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