EP4049045
CLOSED-LOOP CONTROL OF RF TEST ENVIRONMENT
Status:
EP einkaleyfi: Þýðing ekki lögð innEP appl. date:
17.8.2020EP published:
25.9.2024EP application number:
20762016.2
EPO information:
European Patent Register
Max expiry date:
16.8.2040
Title in English:
CLOSED-LOOP CONTROL OF RF TEST ENVIRONMENTLanguage of the patent:
English
Timeline
Today
17.8.2020EP application
25.9.2024EP Publication
Owner
Name:
Raytheon CompanyAddress:
870 Winter Street, Waltham, Massachusetts 02451-1449, US
Inventor
Name:
VAHEY, Scott W.Address:
Goleta, California 93117, US
Name:
RUSSELL, Aubrey J.Address:
Santa Barbara, California 93103, US
Priority
Number:
201916660325Date:
22.10.2019Country:
US
Classification
Categories:
G01R 29/08